Speaker:
Dr. Yu-Chih Tseng
Argonne National Laboratory
Title:
Interface Characterization and Structure for Nanoscale Electronic Devices
Date:
Monday, June 13, 2011
Time:
11:00 am - 12:00 noon
Location:
EIT 3142
Abstract:
Nanoscale materials have extraordinary properties and potential
applications in electronics, optoelectronics, energy conversion, sensing
and medicine. A useful device based on such materials requires integration
with other materials, often with contrasting electrical properties. In
many cases, the interface between the different materials can completely
determine the operating characteristics of a device. Transistors based
on carbon nanotubes or semiconductor nanowires are such an example, where
the electrical contacts and surface modification can influence the device
behavior dramatically. The structure of the material interface can also
have a strong influence, and it is important to be able to engineer it
on the nanoscale.
I will discuss the characterization of material interfaces in individual
semiconductor nanowires and nanotubes using capacitance measurements. The
technique is refined to probe interface properties such as the
Schottky barrier height, interfacial traps, and dopant concentration
in an individual nanowire or nanotube. I will also discuss recent
work in making nanostructures in technologically relevant materials,
for potential applications in semiconductor devices, photovoltaics,
and data storage media.
