Selected Recent Publications

[ Books and Book Chapters | Theses | Journal Papers | Conference Papers ]

• Andrei Pavlov and Manoj Sachdev, "CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies," New York: Springer, ISBN 978-1-4020-8362-4, 2008.



• Oleg Semenov, Hossein Sarbishaei, and Manoj Sachdev, "ESD Protection Device and Circuit Design for Advanced CMOS Technologies," New York: Springer, ISBN 978-1-4020-8300-6, 2008.



• Manoj Sachdev and Jose Pineda de Gyvez, "Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits," New York: Springer, ISBN 978-0-387-46546-3, 2007.



• A. Vassighi and M. Sachdev, "Thermal and Power Management of Integrated Circuits," New York: Springer, ISBN 0-387-25762-4, 2006.



• M. Sachdev, "Defect Oriented Testing for CMOS Analog and Digital Circuits," Kluwer Academic Publishers, ISBN 0-7923-8083-5, 1998.



• M. Sachdev, "Digital CMOS Fault Modeling and Inductive Fault Analysis," pp. 43 -84, chapter in book, Integrated Circuit Manufacturability: The Art of Process and Design Integration, IEEE Press, ISBN 0-7803- 3447-7, 1998.



• M. Sachdev, "Defect Oriented Testing," pp. 15 - 54, chapter in book, Analog and Mixed-Signal Test, Printice Hall, ISBN 0-13-786310-1, 1998.

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